DEPOSICIÓN Y CARACTERIZACIÓN ELECTROQUÍMICA DE PELÍCULAS DELGADAS DE ESTAÑO OBTENIDAS POR JAULA CATÓDICA EN PLASMA H₂/N₂
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https://doi.org/10.56238/isevmjv4n5-015Palabras clave:
Jaula Catódica, TiN, Películas Delgadas, Plasma, Impedancia ElectroquímicaResumen
Este trabajo investiga la deposición de películas delgadas de nitruro de titanio (TiN) mediante descarga de plasma de jaula catódica sobre sustratos de vidrio a baja temperatura (300 °C) y una distancia corta entre el sustrato y la tapa (7 mm). El objetivo fue evaluar el efecto de la relación H₂/N₂ del plasma en las propiedades de la película. Las deposiciones se realizaron a 1 Torr y las películas se caracterizaron mediante difracción de rayos X, reflectometría y espectroscopia de impedancia electroquímica (EIS). El análisis EIS permitió estimar la resistividad eléctrica y la estabilidad química, demostrando condiciones de deposición que favorecen una mayor resistencia a la corrosión. La singularidad de este estudio reside en la combinación de: (i) geometría de jaula catódica con un alto número de agujeros; (ii) una distancia corta entre el sustrato y la tapa (7 mm), que potencia los efectos de cátodo hueco; y (iii) un enfoque electroquímico (EIS) para correlacionar el proceso, la microestructura y las propiedades.
Referencias
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